Non Destructive Testing by Eddy Current Probes – E70s
Thursday, July 31st, 2008E70s – Multichannel Electronic for Non Destructive Testing by Eddy Current Probes
The development of the new generation electronic E70s represents a significant step forward for the solution of complex applications which require the use of a large number of sensors.
With the wide modularity offered by the system, it is possible to configure measuring solutions from a minimum of two channels to a maximum of twelve, further expandable by means of external multiplexers.
The system is able to store up to 256 setting parameters for each one of the 12 sensors. These can be directly connected to the E70s, thus allowing extensive tests for every kind of part that needs to be checked.
A wide range of hardware configurations can suit specific applications. The E70s is available with local or remote operator panels, providing various mounting solutions.
With the new E70s, and a mechanical structure properly designed,today it is possible to verify the surface integrity of parts having a wide surface to be checked, in automatic mode at 100% in the production line.
